Optical Metrology Equipment
C.E. Johansson, "Father of Measurement", of Eskilstuna, Sweden, devoted many years of labor and research to reducing the inaccuracies of the Mid 1800s measuring devices such as the micrometer and the caliper.
In 1897 he produced his first set of precision gage blocks, guaranteed to have an error of less than .000016" per inch of length. Fourteen...
AXIC, Inc. was founded in 1980 as a company to develop surface science equipment for the semiconductor, electronics, and general scientific community. The early stages of the company were involved with determining future equipment requirements for the semiconductor industry which could be filled by a small company with strategic knowledge of...
Spectrum Metrology was formed in 1998 and we are specialists in the field of electro-optical metrology, surface roughness and non-contact metrology applications. Our comprehensive product range is used for a range of applications in a range of industries throughout the world:
